Streamlining programmable device and system test using IEEE Std 1532. - Neil G. Jacobson (ITC, 2000)

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. - Stephen K. Sunter; Adam Osseiran; Adam Cron; Neil G. Jacobson; Dave Bonnett; Bill Eklow; Carl Barnhart; Ben Bennetts (DATE, 2004)

Boundary-Scan Testing of Power/Ground Pins. - Kenneth P. Parker; Neil G. Jacobson (ITC, 2008)

High-speed I/O capabilities added to military automatic test equipment (ATE) using synthetic instruments. - Louis Y. Ungar; Neil G. Jacobson; T. M. Mak (IEEE Instrum. Meas. Mag., 2020)