Ionizing radiation effects on a COTS low-cost RISC microcontroller. - Felipe G. H. Leite; Roberto B. B. Santos; Nilberto H. Medina; Vitor A. P. Aguiar; Renato C. Giacomini; Nemitala Added; Fernando Aguirre; Eduardo L. A. Macchione; Fabian Vargas 001; Marcilei Aparecida Guazzelli da Silveira (LATS, 2017)

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA. - Paulo Ricardo Cechelero Villa; Roger C. Goerl; Fabian Vargas 001; Leticia B. Poehls; Nilberto H. Medina; Nemitala Added; Vitor A. P. de Aguiar; Eduardo L. A. Macchione; Fernando Aguirre; Marcilei Aparecida Guazzelli da Silveira; Eduardo Augusto Bezerra (LATS, 2017)

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. de Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (LATS, 2021)

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. - Tiago R. Balen; Carlos J. González; Ingrid F. V. Oliveira; Leomar S. da Rosa Jr.; Rafael Iankowski Soares; Rafael B. Schvittz; Nemitala Added; Eduardo L. A. Macchione; Vitor A. P. Aguiar; Marcilei Aparecida Guazzelli; Nilberto H. Medina; Paulo F. Butzen (J. Electron. Test., 2023)

Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. - Victor O. Costa; Fabio Benevenuti; Renan Menezes; Lidia Shibuya Sato; Luis Loures; Fernanda Lima Kastensmidt; Nemitala Added; Saulo G. Alberton; Vitor A. P. Aguiar; Nilberto H. Medina (LATS, 2024)

Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection. - Leonardo R. Gobatto; Fabio Benevenuti; Nemitala Added; Saulo G. Alberton; Eduardo L. A. Macchione; Vitor A. P. Aguiar; Nilberto H. Medina; Fernanda Lima Kastensmidt; José Rodrigo Azambuja (LATS, 2024)