HAFREE: A Heatmap-Based Anchor-Free Detector for Apple Defect Detection. - Nguyen Bui Ngoc Han; Ju-Hwan Lee; Dang Thanh Vu; Iqbal Murtza; Hyoung-Gook Kim; Jin Young Kim 002 (IEEE Access, 2024)

Pest and Scratch Detection on Apple Surface Using TricubeNet. - Nguyen Bui Ngoc Han; Ju-Hwan Lee; Jin Young Kim 002; Hyoung-Gook Kim (ICEIC, 2025)