A single event upset tolerant latch with parallel nodes. - Changyong Liu; Nianlong Liu; Zhiting Lin; Xiulong Wu; Chunyu Peng; Qiang Zhao 007; Xuan Li; Junning Chen; Xuan Zeng 001; Xiangdong Hu (IEICE Electron. Express, 2019)

Design of radiation-hardened memory cell by polar design for space applications. - Licai Hao; Li Liu 004; Qi Shi; Bin Qiang; Zhengya Li; Nianlong Liu; Chenghu Dai; Qiang Zhao 007; Chunyu Peng; Wenjuan Lu; Zhiting Lin; Xiulong Wu (Microelectron. J., 2023)