Distributed Cycling in Charge Trap-Based 3D NAND Arrays: Model and Qualification Tests Implications. - Gianluca Nicosia; Niccolò Righetti; Yingda Dong (IMW, 2023)

Experimental Segmentation of Vertical Charge Loss Mechanisms in Charge Trap-Based 3D NAND Arrays. - Luca Chiavarone; Gianluca Nicosia; Niccolò Righetti; Yingda Dong (IRPS, 2024)