A Condensed History Approach to X-Ray Dark Field Effects in Edge Illumination Phase Contrast Simulations. - Nicholas Francken; Joaquim G. Sanctorum; Jens Renders; Pavel Paramonov; Jan Sijbers; Jan De Beenhouwer (EMBC, 2023)

Enhancing Industrial Inspection with Efficient Edge Illumination X-Ray Phase Contrast Simulations. - Nicholas Francken; Pavel Paramonov; Jan Sijbers; Jan De Beenhouwer (EUROCON, 2023)