Under-gate defect formation in Ni-gate AlGaN/GaN high electron mobility transistors. - Patrick G. Whiting; Nicholas G. Rudawski; M. R. Holzworth; Stephen J. Pearton; Kevin S. Jones; Lu Liu 011; T. S. Kang; Fan Ren (Microelectron. Reliab., 2012)

Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts. - Patrick G. Whiting; Nicholas G. Rudawski; M. R. Holzworth; Stephen J. Pearton; Kevin S. Jones; Lu Liu 011; T. S. Kang; Fan Ren (Microelectron. Reliab., 2017)

Fabrication of Microelectrodes on Microchip Sidewalls for Injectable Biomedical Devices. - Shiva Sai Yeshala; Sultan Mahmud; Nicholas G. Rudawski; Ladan Jiracek-Sapieha; Kenneth Fluker; Jack W. Judy; Adam Khalifa (EMBC, 2024)