Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. - Nuno Alves; Yiwen Shi; Nicholas Imbriglia; Jennifer Dworak; Kundan Nepal; R. Iris Bahar (ETS, 2011)

Using implications to choose tests through suspect fault identification. - Jennifer Dworak; Kundan Nepal; Nuno Alves; Yiwen Shi; Nicholas Imbriglia; R. Iris Bahar (ACM Trans. Design Autom. Electr. Syst., 2012)