Single-Event Latchup Vulnerability at the 7-nm FinFET Node. - Nicholas J. Pieper; Yoni Xiong; Alexandra Feeley; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2022)

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment. - Yoni Xiong; Alexandra Feeley; Nicholas J. Pieper; Dennis R. Ball; Balaji Narasimham; John Brockman; N. A. Dodds; S. A. Wender; Shi-Jie Wen; Rita Fung; Bharat L. Bhuva (IRPS, 2022)

Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node. - Nicholas J. Pieper; Yoni Xiong; Dennis R. Ball; J. Pasternak; Bharat L. Bhuva (IRPS, 2023)

Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology. - Yoni Xiong; Yueh Chiang; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2023)

Single-Event Performance of Flip Flop Designs at the 5-nm Bulk FinFET Node at Near-Threshold Supply Voltages. - Jenna B. Kronenberg; Yoni Xiong; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2024)

Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems. - Nicholas J. Pieper; M. Chun; Yoni Xiong; H. M. Dattilo; Jenna B. Kronenberg; Sanghyeon Baeg; Shi-Jie Wen; Rita Fung; D. Chan; C. Escobar; Bharat L. Bhuva (IRPS, 2024)

Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node. - Yoni Xiong; Nicholas J. Pieper; Jenna B. Kronenberg; Dennis R. Ball; Megan Casey; Bharat L. Bhuva (IRPS, 2024)

Power-Aware Mitigation of Logic Soft Error Rates at the 3-nm Bulk FinFET Node. - Jenna B. Kronenberg; Y. Xiong; Nicholas J. Pieper; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2025)

Power and SER Performance of Flip-Flop Cells with Low-Leakage Options. - Nicholas J. Pieper; Y. Xiong; Jenna B. Kronenberg; R. Fung; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2025)