CDM-ESD induced damage in components using stacked-die packaging. - Nicholas Olson; Nathan Jack; Vrashank Shukla; Elyse Rosenbaum (CICC, 2011)

Charged device model electrostatic discharge failures in system on a chip and system in a package designs - Nicholas Olson (2011)

Wireless Network Digital Twin Calibrated by Real Time Telemetry and XR Feedback Interface. - Susruth Sudhakaran; Javier Perez-Ramirez; Dave Cavalcanti 001; Cosmin Cazan; Nicholas Olson; Rafael Rosales; Valerio Frascolla (WFCS, 2024)