New Capability for Generating and Measuring Small DC Currents at NPL. - Nick E. Fletcher; Stephen P. Giblin; Jonathan M. Williams; Keith J. Lines (IEEE Trans. Instrum. Meas., 2007)

New Generation of Low-Frequency Current Comparators Operated at Room Temperature. - Alexandre Satrapinski; Martin Götz; Eckart Pesel; Nick E. Fletcher; Pierre Gournay; Benjamin Rolland (IEEE Trans. Instrum. Meas., 2017)

Metrological Traceability for the Impedance of Coaxial Devices Using an LCR Meter. - James Skinner; Murat Celep; Stephen Protheroe; Nick E. Fletcher; Nick M. Ridler (IEEE Trans. Instrum. Meas., 2025)