Reliability analysis of InGaN Blu-Ray laser diode. - Nicola Trivellin; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni; Kenji Orita; Masaaki Yuri; Tsuyoshi Tanaka; Daisuke Ueda (Microelectron. Reliab., 2009)

Reliability evaluation for Blu-Ray laser diodes. - Matteo Meneghini; Nicola Trivellin; Kenji Orita; Masaaki Yuri; Tsuyoshi Tanaka; Daisuke Ueda; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2010)

Degradation mechanisms of high-power white LEDs activated by current and temperature. - Matteo Dal Lago; Matteo Meneghini; Nicola Trivellin; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2011)

Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. - Nicola Trivellin; Matteo Meneghini; Carlo De Santi; Simone Vaccari; Gaudenzio Meneghesso; Enrico Zanoni; Kenji Orita; S. Takigawa; Tsuyoshi Tanaka; Daisuke Ueda (Microelectron. Reliab., 2011)

Extensive study of reliability and performance of next generation GaN light emitting devices. - Nicola Trivellin (2011)

Phosphors for LED-based light sources: Thermal properties and reliability issues. - Matteo Dal Lago; Matteo Meneghini; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress. - Matteo Meneghini; Matteo Dal Lago; L. Rodighiero; Nicola Trivellin; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2012)

Chip and package-related degradation of high power white LEDs. - Matteo Meneghini; Matteo Dal Lago; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2012)

"Hot-plugging" of LED modules: Electrical characterization and device degradation. - Matteo Dal Lago; Matteo Meneghini; Nicola Trivellin; Giovanna Mura; Massimo Vanzi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)

Variations in junction capacitance and doping activation associated with electrical stress of InGaN/GaN laser diodes. - Carlo De Santi; Matteo Meneghini; S. Carraro; Simone Vaccari; Nicola Trivellin; Stefania Marconi; Michael Marioli; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2013)

ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms. - Matteo Dal Lago; Matteo Meneghini; Carlo De Santi; Marco Barbato; Nicola Trivellin; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)

ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. - Matteo Meneghini; Simone Vaccari; Matteo Dal Lago; Stefano Marconi; Marco Barbato; Nicola Trivellin; Alessio Griffoni; Alberto Alfier; Giovanni Verzellesi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)

Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage. - Carlo De Santi; Matteo Meneghini; Michael Marioli; Matteo Buffolo; Nicola Trivellin; T. Weig; K. Holc; K. Köhler; J. Wagner; U. T. Schwarz; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2014)

Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting. - Nicola Trivellin; Matteo Meneghini; Marco Ferretti; Diego Barbisan; Matteo Dal Lago; Gaudenzio Meneghesso; Enrico Zanoni (RTSI, 2015)

Current induced degradation study on state of the art DUV LEDs. - Nicola Trivellin; Desiree Monti; Carlo De Santi; Matteo Buffolo; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (Microelectron. Reliab., 2018)

Study and Development of a Fluorescence Based Sensor System for Monitoring Oxygen in Wine Production: The WOW Project. - Nicola Trivellin; Diego Barbisan; Denis Badocco; Paolo Pastore; Gaudenzio Meneghesso; Matteo Meneghini; Enrico Zanoni; Giuseppe Belgioioso; Angelo Cenedese (Sensors, 2018)

Current crowding as a major cause for InGaN LED degradation at extreme high current density. - Nicola Trivellin; Matteo Buffolo; Carlo De Santi; Enrico Zanoni; Gaudenzio Meneghesso; Matteo Meneghini (IECON, 2021)

Full Optical Contactless Thermometry Based on LED Photoluminescence. - Nicola Trivellin; Matteo Buffolo; Carlo De Santi; Matteo Meneghini; Michele Forzan; Fabrizio Dughiero; Enrico Zanoni; Gaudenzio Meneghesso (IEEE Trans. Instrum. Meas., 2021)

Autonomous IoT Monitoring Matching Spectral Artificial Light Manipulation for Horticulture. - Irene Cappelli; Ada Fort; Alessandro Pozzebon; Marco Tani; Nicola Trivellin; Valerio Vignoli; Mara Bruzzi (Sensors, 2022)

Perovskite and Silicon Tandem Photovoltaic Cells as a Self-Powered Water Depth Measurement System. - Noah Tormena; Giacomo Peruzzi; Jessica Jazmine Nicole Barrantes; Matteo Bertocco; Tommaso Michelon; Marco Migliorini; Francesco Rigo; Alessandro Pozzebon; Nicola Trivellin (IEEE Trans. Instrum. Meas., 2025)