A new structure to monitor electrical transients during programming of EEPROM memory cells. - Nicolas Baboux; Carole Plossu; Philippe Boivin (Microelectron. Reliab., 2004)

Dynamic Fowler-Nordheim injection in EEPROM tunnel oxides at realistic time scales. - Nicolas Baboux; Carole Plossu; Philippe Boivin (Microelectron. Reliab., 2005)

A new SIMPLORER model for single-electron transistors. - Aimen Boubaker; Nabil Sghaier; M. Troudi; A. Kalboussi; Nicolas Baboux; A. Souifi (Microelectron. J., 2007)

Peculiarities of electron tunnel injection to the drain of EEPROMs. - Nicolas Baboux; C. Busseret; Carole Plossu; Philippe Boivin (Microelectron. Reliab., 2007)

Parameters extraction of hafnium based gate oxide capacitors. - T. Nguyen; C. Busseret; Liviu Militaru; A. Poncet; D. Aimé; Nicolas Baboux; Carole Plossu (Microelectron. Reliab., 2007)

Discussion on the performances of hybrid SET-MOSFET Voltage Controlled Oscillators. - Wei Xuan; Françis Calmon; Nicolas Baboux; Abdelkader Souifi (ICECS, 2009)

Electrical characteristics and modelling of multi-island single-electron transistor using SIMON simulator. - Aimen Boubaker; M. Troudi; Nabil Sghaier; A. Souifi; Nicolas Baboux; A. Kalboussi (Microelectron. J., 2009)