Influence of triple-well technology on laser fault injection and laser sensor efficiency. - Nicolas Borrel; Clement Champeix; Edith Kussener; Wenceslas Rahajandraibe; Mathieu Lisart; Alexandre Sarafianos; Jean-Max Dutertre (DFTS, 2015)

SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. - Clement Champeix; Nicolas Borrel; Jean-Max Dutertre; Bruno Robisson; Mathieu Lisart; Alexandre Sarafianos (DFTS, 2015)

Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. - Clement Champeix; Nicolas Borrel; Jean-Max Dutertre; Bruno Robisson; Mathieu Lisart; Alexandre Sarafianos (IOLTS, 2015)

Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. - Marc Lacruche; Nicolas Borrel; Clement Champeix; Cyril Roscian; Alexandre Sarafianos; Jean-Baptiste Rigaud; Jean-Max Dutertre; Edith Kussener (IOLTS, 2015)

Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. - Nicolas Borrel; Clement Champeix; Mathieu Lisart; Alexandre Sarafianos; Edith Kussener; Wenceslas Rahajandraibe; Jean-Max Dutertre (IRPS, 2015)

Dynamic current reduction of CMOS digital circuits through design and process optimization. - Jordan Innocenti; Loïc Welter; Nicolas Borrel; Franck Julien; Jean-Michel Portal; Jacques Sonzogni; Laurent Lopez; Pascal Masson; Stephan Niel; Philippe Dreux; Julia Castellan (PATMOS, 2015)

Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. - Nicolas Borrel; Clement Champeix; Edith Kussener; Wenceslas Rahajandraibe; Mathieu Lisart; Jean-Max Dutertre; Alexandre Sarafianos (Microelectron. Reliab., 2015)

LDO comparison with new Push-Pulled Flipped Voltage Follower topology for transient response improvement. - Jimmy Fort; Clement Champeix; Nicolas Borrel (DTTIS, 2024)