Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain. - Nicolas Devos; Christophe Ponsard; Jean-Christophe Deprez; Renaud Bauvin; Benedicte Moriau; Guy Anckaerts (ICSE, 2012)

A Constraint-Solving Approach for Achieving Minimal-Reset Transition Coverage of Smartcard Behaviour. - Renaud De Landtsheer; Christophe Ponsard; Nicolas Devos (Electron. Commun. Eur. Assoc. Softw. Sci. Technol., 2014)

How Openness can Change Scientific Practice. - Robert Viseur; Nicolas Devos (ERCIM News, 2015)