TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. - David Trémouilles; Géraldine Bertrand; Marise Bafleur; Felix Beaudoin; Philippe Perdu; Nicolas Guitard; Lionel Lescouzères (Microelectron. Reliab., 2003)

Study of the ESD defects impact on ICs reliability. - Fabien Essely; Corinne Bestory; Nicolas Guitard; Marise Bafleur; A. Wislez; E. Doche; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2004)

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. - Nicolas Guitard; David Trémouilles; Marise Bafleur; Laurent Escotte; Laurent Bary; Philippe Perdu; Gérard Sarrabayrouse; Nicolas Nolhier; Roberto Reyna-Rojas (Microelectron. Reliab., 2004)

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. - Nicolas Guitard; Fabien Essely; David Trémouilles; Marise Bafleur; Nicolas Nolhier; Philippe Perdu; André Touboul; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2005)

Application of various optical techniques for ESD defect localization. - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. - Yuan Gao; Nicolas Guitard; Christophe Salamero; Marise Bafleur; Laurent Bary; Laurent Escotte; Patrick Gueulle; Lionel Lescouzères (Microelectron. Reliab., 2007)

BIMOS transistor and its applications in ESD protection in advanced CMOS technology. - Philippe Galy; Jean Jimenez; Johan Bourgeat; A. Dray; Ghislain Troussier; Boris Heitz; Nicolas Guitard; David Marin-Cudraz; H. Beckrich-Ros (ICICDT, 2012)

Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology. - Philippe Galy; Johan Bourgeat; Jean Jimenez; Nicolas Guitard; Alexandre Dray; Ghislain Troussier; Blaise Jacquier; David Marin-Cudraz (Microelectron. Reliab., 2012)

Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes. - Jorge Loayza; Nicolas Guitard; Bruno Allard; Luong-Viêt Phung; Blaise Jacquier; Philippe Galy (Microelectron. Reliab., 2018)

Smart Way to Adjust Schottky Barrier Height in 130 nm BiCMOS Process for sub-THz Applications. - Vincent Gidel; Frédéric Gianesello; Pascal Chevalier 002; Grégory Avenier; Nicolas Guitard; Michel Buczko; Cyril Luxey; Guillaume Ducournau (RWS, 2020)

Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks. - Grégoire Caron; Anatoli B. Juditsky; Nicolas Guitard; Didier Céli (BCICTS, 2022)