A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. - Alejandro Czutro; Nicolas Houarche; Piet Engelke; Ilia Polian; Mariane Comte; Michel Renovell; Bernd Becker 001 (ETS, 2008)

An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. - Nicolas Houarche; Mariane Comte; Michel Renovell; Alejandro Czutro; Piet Engelke; Ilia Polian; Bernd Becker 001 (VTS, 2009)