An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. - Jinyu Jason Ruan; Nicolas Monnereau; David Trémouilles; Nicolas Mauran; Fabio Coccetti; Nicolas Nolhier; Robert Plana (IEEE Trans. Instrum. Meas., 2012)

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation. - Nicolas Monnereau; Fabrice Caignet; David Trémouilles; Nicolas Nolhier; Marise Bafleur (Microelectron. Reliab., 2013)