Validated 90nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC). - Thierry Devoivre; M. Lunenborg; C. Julien; J.-P. Carrere; P. Ferreira; W. J. Toren; A. VandeGoor; P. Gayet; T. Berger; O. Hinsinger; P. Vannier; Y. Trouiller; et al. (MTDT, 2002)

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs. - Christoforos G. Theodorou; Eleftherios G. Ioannidis; Sébastien Haendler; Nicolas Planes; Franck Arnaud; Jalal Jomaah; Charalambos A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2012)

Ultra-wide body-bias range LDPC decoder in 28nm UTBB FDSOI technology. - Philippe Flatresse; Bastien Giraud; Jean-Philippe Noel; Bertrand Pelloux-Prayer; Fabien Giner; Deepak-Kumar Arora; Franck Arnaud; Nicolas Planes; Julien Le Coz; Olivier Thomas; Sylvain Engels; Giorgio Cesana; et al. (ISSCC, 2013)

Strain and layout management in dual channel (sSOI substrate, SiGe channel) planar FDSOI MOSFETs. - François Andrieu; Mikaël Cassé; E. Baylac; P. Perreau; O. Nier; Denis Rideau; R. Berthelon; Franck Pourchon; A. Pofelski; Barbara De Salvo; C. Gallon; Vincent Mazzocchi; et al. (ESSDERC, 2014)

Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. - Eleftherios G. Ioannidis; Sébastien Haendler; Christoforos G. Theodorou; Nicolas Planes; Charalabos A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2014)

Variability of UTBB MOSFET analog figures of merit in wide frequency range. - Sergej Makovejev; Babak Kazemi Esfeh; Jean-Pierre Raskin; Valeria Kilchytska; Denis Flandre; Vincent Barral; Nicolas Planes; Michel Haond (ESSDERC, 2014)

New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs. - Christoforos G. Theodorou; Eleftherios G. Ioannidis; Sébastien Haendler; Nicolas Planes; Emmanuel Josse; Charalambos A. Dimitriadis; Gérard Ghibaudo (IRPS, 2015)

28nm FDSOI technology sub-0.6V SRAM Vmin assessment for ultra low voltage applications. - Rossella Ranica; Nicolas Planes; Vincent Huard; Olivier Weber; Daniel Noblet; Damien Croain; Fabien Giner; Sylvie Naudet; P. Mergault; S. Ibars; A. Villaret; Maryline Parra; et al. (VLSI Circuits, 2016)

Back-gate bias effect on UTBB-FDSOI non-linearity performance. - B. Kazemi Esfeh; Valeria Kilchytska; Bertrand Parvais; Nicolas Planes; M. Haond; Denis Flandre; Jean-Pierre Raskin (ESSDERC, 2017)

Self-Heating in 28 FDSOI UTBB MOSFETs at Cryogenic Temperatures. - Lucas Nyssens; Arka Halder; Babak Kazemi Esfeh; Nicolas Planes; Michel Haond; Denis Flandre; Jean-Pierre Raskin; Valeriya Kilchytska (ESSDERC, 2019)

Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS. - Florian Cacho; P. Cathelin; Joycelyn Hai; S. Bouvot; Jean-Francois Jozef Nowakowski; M. Martinez; R. Debroucke; S. Jean; R. Paulin; J. Antonijevic; X. Federspiel; Nicolas Planes; et al. (IRPS, 2024)