A non-intrusive method for measuring switching losses of GaN power transistors. - Julio Brandelero; Bernardo Cougo; Thierry Meynard; Nicolas Videau (IECON, 2013)

Integrated dc-dc based-GaN converter with screen printed capacitors allowing double side cooling. - Olivier Goualard; Nicolas Videau; Thierry Meynard; Thi Bang Doan; Thierry Lebey; Vincent Bley; Emmanuel Sarraute (IECON, 2014)