The role of surface barrier oxidation on AlGaN/GaN HEMTs reliability. - Milan Tapajna; Nicole Killat; Uttiya Chowdhury; Jose L. Jimenez; Martin Kuball (Microelectron. Reliab., 2012)

Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale. - Sören Hommel; Nicole Killat; Andreas Altes; Thomas Schweinböck; Doris Schmitt-Landsiedel; Marco Silvestri; Oliver Haeberlen (Microelectron. Reliab., 2016)

Determination of doping type by calibrated capacitance scanning microwave microscopy. - Sören Hommel; Nicole Killat; A. Altes; Thomas Schweinböck; Franz Kreupl (Microelectron. Reliab., 2017)