A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design. - Francesco Maria Puglisi; Nicolo Zagni; Luca Larcher; Paolo Pavan (ESSDERC, 2017)

Variability and sensitivity to process parameters variations in InGaAs dual-gate ultra-thin body MOSFETs: A scaling perspective. - Nicolo Zagni; Francesco Maria Puglisi; Giovanni Verzellesi; Paolo Pavan (PATMOS, 2017)

Energy-Efficient Logic-in-Memory I-bit Full Adder Enabled by a Physics-Based RRAM Compact Model. - Francesco Maria Puglisi; Lorenzo Pacchioni; Nicolo Zagni; Paolo Pavan (ESSDERC, 2018)

A Paradox in ML Design: Less data for a smarter water metering cognification experience. - Marco Roccetti; Giovanni Delnevo; Luca Casini; Nicolò Zagni; Giuseppe Cappiello (GOODTECHS, 2019)

Deep Water: Predicting Water Meter Failures Through a Human-Machine Intelligence Collaboration. - Luca Casini; Giovanni Delnevo; Marco Roccetti; Nicolò Zagni; Giuseppe Cappiello (IHIET, 2019)

Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs. - Nicolò Zagni; Alessandro Chini; Francesco Maria Puglisi; Paolo Pavan; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni; Giovanni Verzellesi (IRPS, 2020)

A Novel Temperature Estimation Technique Exploiting Carrier Emission from Buffer Traps. - Marcello Cioni; Nicolò Zagni; Alessandro Chini (ESSDERC, 2022)

Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications. - Marcello Cioni; Nicolò Zagni; Alessandro Chini (IRPS, 2022)

Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges. - Nicolò Zagni; Francesco Maria Puglisi; Paolo Pavan; Muhammad Ashraful Alam (Proc. IEEE, 2023)