Static Noise Margin based Yield Modelling of 6T SRAM for Area and Minimum Operating Voltage Improvement using Recovery Techniques. - Nidhi Batra; Pawan Sehgal; Shashwat Kaushik; Mohammad S. Hashmi; Sudesh Bhalla; Anuj Grover (ACM Great Lakes Symposium on VLSI, 2016)

A method to estimate effectiveness of weak bit test: Comparison of weak pMOS and WL boost based test - 28nm FDSOI implementation. - Nidhi Batra; Shashwat Kaushik; Anil Kumar Gundu; Mohammad S. Hashmi; G. S. Visweswaran; Anuj Grover (SoCC, 2016)

An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI. - Nidhi Batra; Anil Kumar Gundu; Mohammad S. Hashmi; G. S. Visweswaran; Anuj Grover (VDAT, 2016)