Statistical uncertainty analysis of key comparison CCEM-K2. - Nien Fan Zhang; Nell Sedransk; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2003)

SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. - Dean G. Jarrett; Randolph E. Elmquist; Nien Fan Zhang; Alejandra Tonina; Marta Porfiri; Janice de Brito Fernandes; Helio Schechter; Daniel Izquierdo 003; Carlos Faverio; Daniel Slomovitz; David Inglis; Kai Wendler; et al. (IEEE Trans. Instrum. Meas., 2009)

Monitoring Process Variability for Stationary Process Data. - Nien Fan Zhang; Adam L. Pintar (Qual. Reliab. Eng. Int., 2015)