Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. - Dragoljub Gagi Drmanac; Nik Sumikawa; LeRoy Winemberg; Li-C. Wang; Magdy S. Abadir (DATE, 2011)

Forward prediction based on wafer sort data - A case study. - Nik Sumikawa; Dragoljub Gagi Drmanac; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (ITC, 2011)

Understanding customer returns from a test perspective. - Nik Sumikawa; Dragoljub Gagi Drmanac; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (VTS, 2011)

Novel test detection to improve simulation efficiency - A commercial experiment. - Wen Chen 016; Nik Sumikawa; Li-C. Wang; Jayanta Bhadra; Xiushan Feng; Magdy S. Abadir (ICCAD, 2012)

Functional test content optimization for peak-power validation - An experimental study. - Vinayak Kamath; Wen Chen 016; Nik Sumikawa; Li-C. Wang (ITC, 2012)

Screening customer returns with multivariate test analysis. - Nik Sumikawa; Jeff Tikkanen; Li-C. Wang; LeRoy Winemberg; Magdy S. Abadir (ITC, 2012)

An experiment of burn-in time reduction based on parametric test analysis. - Nik Sumikawa; Li-C. Wang; Magdy S. Abadir (ITC, 2012)

Data mining based prediction paradigm and its applications in design automation. - Magdy S. Abadir; Nik Sumikawa; Wen Chen 016; Li-C. Wang (VLSI-DAT, 2012)

A pattern mining framework for inter-wafer abnormality analysis. - Nik Sumikawa; Li-C. Wang; Magdy S. Abadir (ITC, 2013)

Multivariate outlier modeling for capturing customer returns - How simple it can be. - Jeff Tikkanen; Nik Sumikawa; Li-C. Wang; Magdy S. Abadir (IOLTS, 2014)

Yield optimization using advanced statistical correlation methods. - Jeff Tikkanen; Sebastian Siatkowski; Nik Sumikawa; Li-C. Wang; Magdy S. Abadir (ITC, 2014)

Reliability/yield trade-off in mitigating "no trouble found" field returns. - Amr Haggag; Nik Sumikawa; Aamer Shaukat (IOLTS, 2015)

Mitigating "No trouble found" component returns. - Amr Haggag; Nik Sumikawa; Aamer Shaukat; J. K. Jerry Lee; Nick Aghel; Charlie Slayman (IRPS, 2015)

Generalization of an outlier model into a "global" perspective. - Sebastian Siatkowski; Chia-Ling Chang; Li-C. Wang; Nikolas Sumikawa; LeRoy Winemberg; W. Robert Daasch (ITC, 2015)

Consistency in wafer based outlier screening. - Sebastian Siatkowski; Chuanhe Jay Shan; Li-C. Wang; Nikolas Sumikawa; W. Robert Daasch; John M. Carulli (VTS, 2016)

Kernel based clustering for quality improvement and excursion detection. - Nik Sumikawa; Matt Nero; Li-C. Wang (ITC, 2017)

Some considerations on choosing an outlier method for automotive product lines. - Li-C. Wang; Sebastian Siatkowski; Chuanhe Jay Shan; Matthew Nero; Nikolas Sumikawa; LeRoy Winemberg (ITC, 2017)

Learning the process for correlation analysis. - Sebastian Siatkowski; Li-C. Wang; Nik Sumikawa; LeRoy Winemberg (VTS, 2017)

Concept Recognition in Production Yield Data Analytics. - Matthew Nero; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (ITC, 2018)

Discovering Interesting Plots in Production Yield Data Analytics. - Matthew Nero; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (CoRR, 2018)

Wafer Plot Classification Using Neural Networks and Tensor Methods. - Ahmed Wahba; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (ITC-Asia, 2019)

Deploying A Machine Learning Solution As A Surrogate. - Chuanhe Jay Shan; Ahmed Wahba; Li-C. Wang; Nik Sumikawa (ITC, 2019)

Primitive Concept Identification In A Given Set Of Wafer Maps. - Ahmed Wahba; Chuanhe Jay Shan; Li-C. Wang; Nik Sumikawa (VLSI-DAT, 2019)

Wafer Pattern Recognition Using Tucker Decomposition. - Ahmed Wahba; Li-C. Wang; Zheng Zhang 005; Nik Sumikawa (VTS, 2019)

Learning A Wafer Feature With One Training Sample. - Yueling Jenny Zeng; Li-C. Wang; Chuanhe Jay Shan; Nik Sumikawa (ITC, 2020)