DFT + DFD: An Integrated Method for Design for Testability and Diagnosability. - Nikhil P. Rahagude; Maheshwar Chandrasekar; Michael S. Hsiao (Asian Test Symposium, 2010)

Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation. - Maheshwar Chandrasekar; Nikhil P. Rahagude; Michael S. Hsiao (J. Electron. Test., 2010)

Design-for-test methodology for non-scan at-speed testing. - Mainak Banga; Nikhil P. Rahagude; Michael S. Hsiao (DATE, 2011)