Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments. - Muhammad Sajid 003; Nikolay G. Chechenin; Frank Sill Torres; Usman Ali Gulzari; Muhammad Usman Butt; Zhu Ming; E. U. Khan (Microelectron. Reliab., 2017)

Clusters of Spin Valve Sensors in 3D Magnetic Field of a Label. - Georgy V. Babaytsev; Nikolay G. Chechenin; Irina O. Dzhun; Mikhail G. Kozin; Alexey V. Makunin; Irina L. Romashkina (Sensors, 2021)