Analysis of failure sources in surface-micromachined MEMS. - Nilmoni Deb; Ronald D. Blanton (ITC, 2000)

Built-In Self Test of CMOS-MEMS Accelerometers. - Nilmoni Deb; R. D. (Shawn) Blanton (ITC, 2002)

Multi-Modal Built-In Self-Test for Symmetric Microsystems. - Nilmoni Deb; R. D. (Shawn) Blanton (VTS, 2004)