Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. - Riccardo Cantoro; Francesco Garau; Patrick Girard 001; Nima Kolahimahmoudi; Sandro Sartoni; Matteo Sonza Reorda; Arnaud Virazel (ETS, 2022)

A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. - Paolo Bernardi; Giorgio Insinga; Nima Kolahimahmoudi (VLSI-SoC, 2023)

A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements. - Nima Kolahimahmoudi; Giorgio Insinga; Stefano Roggi; Josef Niederl; Paolo Bernardi (DTTIS, 2024)