Near-threshold circuit variability in 14nm FinFETs for ultra-low power applications. - Sriram Balasubramanian; Ninad Pimparkar; Mangesh Kushare; Vinayak Mahajan; Juhi Bansal; Takashi Shimizu; Vivek Joshi; Kun Qian; Arunima Dasgupta; Karthik Chandrasekaran; Chad Weintraub; Ali Icel (ISQED, 2016)

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. - Pratik B. Vyas; Ninad Pimparkar; Robert Tu; Wafa Arfaoui; Germain Bossu; Mahesh Siddabathula; Steffen Lehmann; Jung-Suk Goo; Ali B. Icel (IRPS, 2021)