Aluminum Nitride reconfigurable RF-MEMS front-ends. - Augusto Tazzoli; Matteo Rinaldi; Chengjie Zuo; Nipun Sinha; Jan Van der Spiegel; Gianluca Piazza (ASICON, 2011)

Coupled accelerated stress tests for comprehensive field reliability - Synergistic effects of moisture and temperature cycling. - Ankur Aggarwal; Enamul Kabir; David Huitink; Nipun Sinha; Emre Armagan; Keqin Cao (IRPS, 2015)