Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics. - Nishad Patil; Jose Celaya; Diganta Das; Kai Goebel; Michael G. Pecht (IEEE Trans. Reliab., 2009)

Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics. - Nishad Patil; Diganta Das; Michael G. Pecht (CE, 2010)

A prognostic approach for non-punch through and field stop IGBTs. - Nishad Patil; Diganta Das; Michael G. Pecht (Microelectron. Reliab., 2012)

Long term storage reliability of antifuse field programmable gate arrays. - Nishad Patil; Diganta Das; Estelle Scanff; Michael G. Pecht (Microelectron. Reliab., 2013)

Anomaly detection for IGBTs using Mahalanobis distance. - Nishad Patil; Diganta Das; Michael G. Pecht (Microelectron. Reliab., 2015)