Modeling and Validation of Silicon Contour-Based Extraction and Simulation of Non-Uniform Devices. - Thierry Devoivre; Richard Rouse; Nishath Verghese; Philippe Hurat (CICC, 2007)

Addressing Parametric Impact of Systematic Pattern Variations in Digital IC Design. - Pei-Hua Wang; Brian Lee; Gus Han; Richard Rouse; Philippe Hurat; Nishath Verghese (CICC, 2007)

Context-specific leakage and delay analysis of a 65nm standard cell library for lithography-induced variability. - Darsun Tsiena; Chien Kuo Wang; William W. J. Wang; Yajun Ran; Philippe Hurat; Nishath Verghese (SoCC, 2007)

Predictive models and CAD methodology for pattern dependent variability. - Nishath Verghese; Richard Rouse; Philippe Hurat (ASP-DAC, 2008)