At-speed capture global noise reduction & low-power memory test architecture. - Bonita Bhaskaran; Sailendra Chadalavada; Shantanu Sarangi; Nithin Valentine; Venkat Abilash Reddy Nerallapally; Ayub Abdollahian (VTS, 2017)

On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). - Seyed Nima Mozaffari; Bonita Bhaskaran; Shantanu Sarangi; Suhas M. Satheesh; Kuo Lin Fu; Nithin Valentine; P. Manikandan; Mahmut Yilmaz (VTS, 2022)