Spectral RTL Test Generation for Gate-Level Stuck-at Faults. - Nitin Yogi; Vishwani D. Agrawal (ATS, 2006)

Spectral RTL Test Generation for Microprocessors. - Nitin Yogi; Vishwani D. Agrawal (VLSI Design, 2007)

Sequential Circuit BIST Synthesis Using Spectrum and Noise from ATPG Patterns. - Nitin Yogi; Vishwani D. Agrawal (ATS, 2008)

Application of signal and noise theory to digital VLSI testing. - Nitin Yogi; Vishwani D. Agrawal (VTS, 2010)