Observation of Quantized Voltage Steps Using a Josephson Junction Array Driven by Optoelectronically Generated Pulses. - Chiharu Urano; Nobu-hisa Kaneko; Masaaki Maezawa; Taro Itatani; Sucheta Gorwadkar; Hiroshi Saitou; J. Maeda; Shogo Kiryu (IEEE Trans. Instrum. Meas., 2007)

Current Status of Josephson Arbitrary Waveform Synthesis at NMIJ/AIST. - Nobu-hisa Kaneko; Michitaka Maruyama; Chiharu Urano (IEICE Trans. Electron., 2011)

Development of Quantum Hall Array Resistance Standards at NMIJ. - Takehiko Oe; Kenjiro Matsuhiro; Taro Itatani; Sucheta Gorwadkar; Shogo Kiryu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2011)

Novel 100-Omega Metal Foil Resistor. - Yasuhiko Sakamoto; Nobu-hisa Kaneko; Takehiko Oe; Masaya Kumagai; Matsuo Zama (IEEE Trans. Instrum. Meas., 2011)

Characterization of 100-Ω Metal Foil Standard Resistors. - Atsushi Domae; Takehiko Oe; Masaya Kumagai; Matsuo Zama; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2013)

First Attempt to Develop an On-Chip Double-Shielded QHR Device for Use in AC Measurements. - Nobu-hisa Kaneko; Atsushi Domae; Takehiko Oe; Jürgen Schurr; Franz-Josef Ahlers; Shogo Kiryu (IEEE Trans. Instrum. Meas., 2013)

New Design of Quantized Hall Resistance Array Device. - Takehiko Oe; Kenjiro Matsuhiro; Taro Itatani; Sucheta Gorwadkar; Shogo Kiryu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2013)

Optimization of Mn3Ag1-x CuxN Antiperovskite Compound Fabrication for Resistance Standard. - Takehiko Oe; Chiharu Urano; Motoyoshi Hadano; Atsushi Ozawa; Koshi Takenaka; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2013)

Native Graphene Oxides at Graphene Edges. - Shinsuke Shimamoto; Yuichi Naitou; Yasuhiro Fukuyama; Shogo Kiryu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2013)

AC/DC Transfer Technique for Measuring Thomson Coefficient: Toward Thermoelectric Metrology. - Yasutaka Amagai; Atsushi Yamamoto; Megumi Akoshima; Hiroyuki Fujiki; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Uncertainty Evaluation of a 10 V RMS Sampling Measurement System Using the AC Programmable Josephson Voltage Standard. - Shih-Fang Chen; Yasutaka Amagai; Michitaka Maruyama; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Development and Evaluation of High-Stability Metal-Foil Resistor With a Resistance of 1 kΩ. - Atsushi Domae; Takayuki Abe; Masaya Kumagai; Matsuo Zama; Takehiko Oe; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Development of 7.75 Ratio Voltage Divider Toward a Precise Measurement of Decade Resistance Based on the AC Quantized Hall Resistance. - Atsushi Domae; Norihiko Sakamoto; Syogo Kiryu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard. - Yasuhiro Fukuyama; Randolph E. Elmquist; Lung-I Huang; Yanfei Yang; Fan-Hung Liu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study. - Nobu-hisa Kaneko; Takehiko Oe; Wan-Seop Kim; Dong-Hun Chae; Randolph E. Elmquist; Marlin Kraft (IEEE Trans. Instrum. Meas., 2015)

Calibration System for Zener Voltage Standards Using a 10 V Programmable Josephson Voltage Standard at NMIJ. - Michitaka Maruyama; Akio Iwasa; Hirotake Yamamori; Shih-Fang Chen; Chiharu Urano; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Evaluation of Linearity Characteristics in Digital Voltmeters Using a PJVS System With a 10-K Cooler. - Michitaka Maruyama; Hikari Takahashi; Kenichi Katayama; Takahito Yonezawa; Takahiro Kanai; Akio Iwasa; Chiharu Urano; Shogo Kiryu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Single-Electron Pumping by Parallel SINIS Turnstiles for Quantum Current Standard. - Shuji Nakamura; Yuri A. Pashkin; Jaw-Shen Tsai; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2015)

Antiperovskite Manganese Nitride Standard Resistor. - Takehiko Oe; Chiharu Urano; Nobu-hisa Kaneko; Hiroshi Eisaki; Yoshiyuki Yoshida; Atsushi Yamamoto; Koshi Takenaka (IEEE Trans. Instrum. Meas., 2015)

Experimental Demonstration of Current Dependence Evaluation of Voltage Divider Based on Quantized Hall Resistance Voltage Divider. - Atsushi Domae; Takehiko Oe; Syogo Kiryu; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2017)

Study of Contact Resistance in Connectors With Physical Simulation Using Nanofabrication. - Yasuhiro Fukuyama; Norihiko Sakamoto; Takaya Kondo; Masanori Onuma; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2017)

Development of 1 Ω and 10 Ω Metal-Foil Standard Resistors. - Nobu-hisa Kaneko; Takehiko Oe; Takayuki Abe; Masaya Kumagai; Matsuo Zama (IEEE Trans. Instrum. Meas., 2017)

Preparation and Characterization of Sn-BSTS Topological Insulator for Universality Test of the Quantum Hall Effect. - Tetsuro Misawa; Yasuhiro Fukuyama; Yuma Okazaki; Shuji Nakamura; Nariaki Nasaka; Takao Sasagawa; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2017)

Evaluation of Automatic Coaxial Mechanical Scanners for Precise Resistance and Capacitance Measurements. - Takehiko Oe; Atsushi Domae; Norihiko Sakamoto; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2017)

Development of 1 MΩ Quantum Hall Array Resistance Standards. - Takehiko Oe; Sucheta Gorwadkar; Taro Itatani; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2017)

Measuring the Boltzmann's Constant Using Superconducting Integrated Circuit. - Chiharu Urano; Takahiro Yamada; Masaaki Maezawa; Kazuaki Yamazawa; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2017)

Characterization of $1 mathrm{k} Omega$ Metal-Foil Standard Resistors and Continuing Drift-Rate Evaluation of 1 $ Omega$ and $10 Omega$ Standard Resistors. - Takayuki Abe; Takehiko Oe; Masaya Kumagai; Matsuo Zama; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2019)

Low-Frequency AC-DC Differences of a Series-Parallel Circuit of Thermal Converters. - Yasutaka Amagai; Hiroyuki Fujiki; Kenjiro Okawa; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2019)

Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. - Takehiko Oe; Albert F. Rigosi; Mattias Kruskopf; Bi-Yi Wu; Hsin-Yen Lee; Yanfei Yang; Randolph E. Elmquist; Nobu-hisa Kaneko; Dean G. Jarrett (IEEE Trans. Instrum. Meas., 2020)

Measurement of the Melting Point of Gallium Using a Johnson Noise Thermometer. - Chiharu Urano; Kazuaki Yamazawa; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2020)

Low-Frequency Characteristics of Silicon-Based High-Current Multijunction Thermal Current Converters Fabricated by Wet Chemical Etching. - Yasutaka Amagai; Stefan Cular; Joseph A. Hagmann; Thomas E. Lipe; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2021)

Mathematical Modeling and Measurement of Low Frequency Characteristics of Single-Junction Thermal Converters. - Vladimir Bubanja; Yasutaka Amagai; Kenjiro Okawa; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2022)

Subfemtoampere Resolved Ionization Current Measurements Using a High-Resistance Transimpedance Amplifier. - Yuma Okazaki; Takahiro Tanaka; Norio Saito; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2022)

Signal-to-Noise Ratio Optimization for Planar Multijunction Thermal Converters. - Yasutaka Amagai; Kenjiro Okawa; Norihiko Sakamoto; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2023)

Stable Voltage Generation With a Josephson Voltage Standard Device Cooled at a 4 K Stage in a Dilution Refrigerator. - Daiki Matsumaru; Shuji Nakamura; Michitaka Maruyama; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2023)

Cryogenic Operation of Electromechanical Relay for Reversal of Quantized Current Generated by a Single-Electron Pump. - Shuji Nakamura; Daiki Matsumaru; Gento Yamahata; Takehiko Oe; Yuma Okazaki; Shintaro Takada; Michitaka Maruyama; Akira Fujiwara; Nobu-hisa Kaneko (IEEE Trans. Instrum. Meas., 2023)

Effects of Shielding and Guarding Electrodes on Electrostatic-Force Balance Measurements in a Coaxial Cylindrical Capacitor. - Kazuaki Fujita; Nobu-hisa Kaneko; Atsushi Domae; Yasutaka Amagai; Takayasu Fujino; Naoki Kuramoto (IEEE Trans. Instrum. Meas., 2025)

Extremely Stable 10 kΩ Metal Foil Resistors in n Ω/Ω Level. - Takehiko Oe; Nobu-hisa Kaneko; Hideaki Nozato; Hideyuki Suma; Matsuo Zama; Masaya Kumagai (IEEE Trans. Instrum. Meas., 2025)