Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator. - Tohlu Matsushima; Nobuaki Ikehara; Takashi Hisakado; Osami Wada (EMC Compo, 2013)

Relation between internal terminal voltage and immunity behavior of LDO regulator circuits. - Hidetoshi Miyahara; Nobuaki Ikehara; Tohlu Matsushima; Takashi Hisakado; Osami Wada (EMC Compo, 2015)