A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology. - Masako Fujii; Koji Nii; Hiroshi Makino; Shigeki Ohbayashi; Motoshige Igarashi; Takeshi Kawamura; Miho Yokota; Nobuhiro Tsuda; Tomoaki Yoshizawa; Toshikazu Tsutsui; Naohiko Takeshita; Naofumi Murata; et al. (IEICE Trans. Electron., 2008)

A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule. - Masanori Kurimoto; Jun Matsushima; Shigeki Ohbayashi; Yoshiaki Fukui; Michio Komoda; Nobuhiro Tsuda (ACM Trans. Design Autom. Electr. Syst., 2012)