Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. - Hiroshi Takahashi; Nobuhiro Yanagida; Yuzo Takamatsu (Asian Test Symposium, 1995)

Multiple Fault Diagnosis by Sensitizing Input Pairs. - Nobuhiro Yanagida; Hiroshi Takahashi; Yuzo Takamatsu (IEEE Des. Test Comput., 1995)

Multiple fault diagnosis in combinational circuits using sensitizing input-pairs. - Nobuhiro Yanagida; Hiroshi Takahashi; Yuzo Takamatsu (Syst. Comput. Jpn., 1995)

Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs. - Nobuhiro Yanagida; Hiroshi Takahashi; Yuzo Takamatsu (FTCS, 1996)

Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. - Nobuhiro Yanagida; Hiroshi Takahashi; Yuzo Takamatsu (Asian Test Symposium, 1998)

Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. - Hiroshi Takahashi; Kwame Osei Boateng; Yuzo Takamatsu; Nobuhiro Yanagida (Asian Test Symposium, 1999)