Test generation systems in Japan. - Shigehiro Funatsu; Nobuo Wakatsuki; Toshihiro Arima (DAC, 1975)

Automatic test generation for large digital circuits. - Akihiko Yamada; Nobuo Wakatsuki; Hideo Shibano; Osamu Itoh; Kyoji Tomita; Shigehiro Funatsu (DAC, 1977)

Automatic System Level Test Generation and Fault Location for Large Digital Systems. - Akihiko Yamada; Nobuo Wakatsuki; T. Fukui; Shigehiro Funatsu (DAC, 1978)