Reliability of Diode-Integrated SiC Power MOSFET(DioMOS). - Osamu Kusumoto; Atsushi Ohoka; Nobuyuki Horikawa; Kohtaro Tanaka; Masahiko Niwayama; Masao Uchida; Yoshihiko Kanzawa; Kazuyuki Sawada; Tetsuzo Ueda (Microelectron. Reliab., 2016)