High-Resolution Analog Measurement on Mixed-Signal LSI Tester. - Kohei Akiyama; Hiroshi Nishimura; Kyoji Anazawa; Akito Kishida; Nobuyuki Kasuga (ITC, 1989)

An advanced test system architecture for synchronous and asynchronous control of mixed signal device testing. - Jun Kurita; Nobuyuki Kasuga; Kiyoyasu Hiwada (ITC, 1990)