Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. - Yuki Yamagata; Kenichi Ichino; Masayuki Arai; Satoshi Fukumoto; Kazuhiko Iwasaki; Masayuki Satoh; Hiroyuki Itabashi; Takashi Murai; Nobuyuki Otsuka (Asian Test Symposium, 2003)

A DC-isolated gate drive IC with drive-by-microwave technology for power switching devices. - Shuichi Nagai; Noboru Negoro; Takeshi Fukuda; Nobuyuki Otsuka; Hiroyuki Sakai 001; Tetsuzo Ueda; Tsuyoshi Tanaka; Daisuke Ueda (ISSCC, 2012)

Recent progress in GaN devices for power and integrated circuit. - Nobuyuki Otsuka; Yasufumi Kawai; Shuichi Nagai (ASICON, 2017)