Creep lifetime prediction of solder joint for heat sink assembly. - Changwoon Han; Chulmin Oh; Nochang Park; Wonsik Hong (Microelectron. Reliab., 2010)

Field failure mechanism study of solder interconnection for crystalline silicon photovoltaic module. - Jae-Seong Jeong; Nochang Park; Changwoon Han (Microelectron. Reliab., 2012)

Effect of moisture condensation on long-term reliability of crystalline silicon photovoltaic modules. - Nochang Park; Changwoon Han; Donghwan Kim (Microelectron. Reliab., 2013)

The degradation of multi-crystalline silicon solar cells after damp heat tests. - Wonwook Oh; Seongtak Kim; Soo Hyun Bae; Nochang Park; Yoonmook Kang; Hae-Seok Lee; Donghwan Kim (Microelectron. Reliab., 2014)

Estimation of the degradation rate of multi-crystalline silicon photovoltaic module under thermal cycling stress. - Nochang Park; Jae-Seong Jeong; Changwoon Han (Microelectron. Reliab., 2014)

Field degradation prediction of potential induced degradation of the crystalline silicon photovoltaic modules based on accelerated test and climatic data. - Wonwook Oh; Soo Hyun Bae; Sung-Il Chan; Hae-Seok Lee; Donghwan Kim; Nochang Park (Microelectron. Reliab., 2017)

Analysis of semiconductor fault using DS (damped sinusoidal) HPEM injection. - Dongshin Kim 004; Ju-Hwan Choi; Nochang Park; Sung-Il Chan; Yongchae Jeong (Microelectron. Reliab., 2018)

Initial detection of potential-induced degradation using dark I-V characteristics of crystalline silicon photovoltaic modules in the outdoors. - Wonwook Oh; Soo Hyun Bae; Donghwan Kim; Nochang Park (Microelectron. Reliab., 2018)