Increasing the security level of analog IPs by using a dedicated vulnerability analysis methodology. - Noemie Beringuier-Boher; David Hély; Vincent Beroulle; Joel Damiens; Philippe Candelier (ISQED, 2013)

Voltage Glitch Attacks on Mixed-Signal Systems. - Noemie Beringuier-Boher; Kamil Gomina; David Hély; Jean-Baptiste Rigaud; Vincent Beroulle; Assia Tria; Joel Damiens; Philippe Gendrier; Philippe Candelier (DSD, 2014)

Laser attacks on integrated circuits: From CMOS to FD-SOI. - Jean-Max Dutertre; Stephan De Castro; Alexandre Sarafianos; Noemie Boher; Bruno Rouzeyre; Mathieu Lisart; Joel Damiens; Philippe Candelier; Marie-Lise Flottes; Giorgio Di Natale (DTIS, 2014)

Laser-induced fault effects in security-dedicated circuits. - Régis Leveugle; Paolo Maistri; Pierre Vanhauwaert; Feng Lu; Giorgio Di Natale; Marie-Lise Flottes; Bruno Rouzeyre; Athanasios Papadimitriou; David Hély; Vincent Beroulle; Guillaume Hubert; Stephan De Castro; et al. (VLSI-SoC, 2014)

On the use of Forward Body Biasing to decrease the repeatability of laser-induced faults. - Marc Lacruche; Noemie Beringuier-Boher; Jean-Max Dutertre; Jean-Baptiste Rigaud; Edith Kussener (DATE, 2016)

Body Biasing Injection Attacks in Practice. - Noemie Beringuier-Boher; Marc Lacruche; David El-Baze; Jean-Max Dutertre; Jean-Baptiste Rigaud; Philippe Maurine (CS2@HiPEAC, 2016)

Clock generator behavioral modeling for supply voltage glitch attack effects analysis. - Noemie Beringuier-Boher; Vincent Beroulle; David Hély; Joel Damiens; Philippe Candelier (Microprocess. Microsystems, 2016)

A Fast Characterization Method for Semi-invasive Fault Injection Attacks. - Lichao Wu; Gerard Ribera; Noemie Beringuier-Boher; Stjepan Picek (CT-RSA, 2020)

Trusted SMEs for Sustainable Growth of Europeans Economical Backbone to Strengthen the Digital Sovereignty: The KDT Resilient Trust Project. - Hassan Aboushady; Noemie Beringuier-Boher; Kelly Burke; Philippe Dallemagne; Mario De Biase; Manuel Di Frangia; Virginie Deniau; Enrico Ferrari; Christophe Gaquière; Dominique Morche; Fabio Patrone; Stefano Pesci; et al. (DSD, 2024)

Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes. - Shayesteh Masoumian; Roel Maes; Noemie Beringuier-Boher; Karthik Keni Yerriswamy; Geert Jan Schrijen; Said Hamdioui; Mottaqiallah Taouil (ETS, 2025)