A Background Self-Calibrated 6b 2.7 GS/s ADC With Cascade-Calibrated Folding-Interpolating Architecture. - Yuji Nakajima; Akemi Sakaguchi; Toshio Ohkido; Norihito Kato; Tetsuya Matsumoto; Michio Yotsuyanagi (IEEE J. Solid State Circuits, 2010)

A 7b 1.4GS/s ADC with offset drift suppression techniques for one-time calibration. - Yuji Nakajima; Norihito Kato; Akemi Sakaguchi; Toshio Ohkido; Kenji Shimomaki; Hiroko Masuda; Chikahiro Shiroma; Michio Yotsuyanagi; Takahiro Miki (CICC, 2012)

A 7-bit, 1.4 GS/s ADC With Offset Drift Suppression Techniques for One-Time Calibration. - Yuji Nakajima; Norihito Kato; Akemi Sakaguchi; Toshio Ohkido; Takahiro Miki (IEEE Trans. Circuits Syst. I Regul. Pap., 2013)

A Low Noise and Linearity Improvement CMOS Image Sensor for Surveillance Camera with Skew-Relaxation Local Multiply Circuit and On-Chip Testable Ramp Generator. - Wataru Saito; Yoichi Iizuka; Norihito Kato; Ryota Otake; Fukashi Morishita (A-SSCC, 2021)

A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems. - Fukashi Morishita; Norihito Kato; Satoshi Okubo; Takao Toi; Mitsuru Hiraki; Sugako Otani; Hideaki Abe; Yuji Shinohara; Hiroyuki Kondo (VLSI Circuits, 2021)

High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor. - Fukashi Morishita; Wataru Saito; Norihito Kato; Yoichi Iizuka; Masao Ito (IEICE Trans. Electron., 2022)

A 30.2-µ Vrms Horizontal Streak Noise 8.3-Mpixel 60-Frames/s CMOS Image Sensor With Skew-Relaxation ADC and On-Chip Testable Ramp Generator for Surveillance Camera. - Fukashi Morishita; Wataru Saito; Yoichi Iizuka; Norihito Kato; Ryota Otake; Masao Ito (IEEE J. Solid State Circuits, 2022)

Circuit Techniques to Improve Low-Light Characteristics and High-Accuracy Evaluation System for CMOS Image Sensor. - Norihito Kato; Fukashi Morishita; Satoshi Okubo; Masao Ito (Sensors, 2022)