Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. - Norio Kuji; Teruo Tamama (ITC, 1985)

A Fully-Automated Electron Beam Test System for VLSI Circuits. - Norio Kuji; Teruo Tamama; Takao Yano (IEEE Des. Test, 1985)

An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs. - Norio Kuji; Teruo Tamama (ITC, 1986)

Integrating an Electron-Beam System into VLSI Fault Diagnosis. - Teruo Tamama; Norio Kuji (IEEE Des. Test, 1986)

FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. - Norio Kuji; Teruo Tamama; M. Nagatani (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986)

Marginal fault diagnosis based on e-beam static fault imaging with CAD interface. - Norio Kuji; Kiyoshi Matsumoto (ITC, 1990)

Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. - Norio Kuji (Asian Test Symposium, 1997)

EB-Testing-Pad Method and Its Evaluation by Actual Devices. - Norio Kuji; Takako Ishihara (Asian Test Symposium, 2001)

Hybrid processing system for sensor networks based on an event-driven framework. - Noriharu Miyaho; Yoichi Iwaki; Tomohiro Yamazaki; Norio Kuji (IET Commun., 2010)