Compact Double-Gate Metal-Oxide-Semiconductor Field Effect Transistor Model for Device/Circuit Optimization. - Norio Sadachika; Takahiro Murakami; Hideki Oka; Ryou Tanabe; Hans Jürgen Mattausch; Mitiko Miura-Mattausch (IEICE Trans. Electron., 2008)

Non-quasi-static approach with surface-potential-based MOSFET model HiSIM for RF circuit simulations. - Tatsuya Ezaki; Dondee Navarro; Youichi Takeda; Norio Sadachika; Gaku Suzuki; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Tatsuya Ohguro; Takahiro Iizuka; Masahiko Taguchi; Shigetaka Kumashiro; Shunsuke Miyamoto (Math. Comput. Simul., 2008)

A PN Junction-Current Model for Advanced MOSFET Technologies. - Ryosuke Inagaki; Norio Sadachika; Mitiko Miura-Mattausch; Yasuaki Inoue (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2009)

Non-Quasi-Static Carrier Dynamics of MOSFETs under Low-Voltage Operation. - Masataka Miyake; Daisuke Hori; Norio Sadachika; Uwe Feldmann; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Takahiro Iizuka; Kazuya Matsuzawa; Yasuyuki Sahara; Teruhiko Hoshida; Toshiro Tsukada (IEICE Trans. Electron., 2009)

Degraded Frequency-Tuning Range and Oscillation Amplitude of LC-VCOs due to the Nonquasi-Static Effect in MOS Varactors. - Masataka Miyake; Daisuke Hori; Norio Sadachika; Uwe Feldmann; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Tatsuya Ohguro; Takahiro Iizuka; Masahiko Taguchi; Shunsuke Miyamoto (IEICE Trans. Electron., 2009)

A GIDL-Current Model for Advanced MOSFET Technologies without Binning. - Ryosuke Inagaki; Norio Sadachika; Dondee Navarro; Mitiko Miura-Mattausch; Yasuaki Inoue (IPSJ Trans. Syst. LSI Des. Methodol., 2009)

Measurement-Based Ring Oscillator Variation Analysis. - Koh Johguchi; Akihiro Kaya; Shinya Izumi; Hans Jürgen Mattausch; Tetsushi Koide; Norio Sadachika (IEEE Des. Test Comput., 2010)

Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design. - Norio Sadachika; Shu Mimura; Akihiro Yumisaki; Koh Johguchi; Akihiro Kaya; Mitiko Miura-Mattausch; Hans Jürgen Mattausch (IEICE Trans. Electron., 2011)