Exploring the Mysteries of System-Level Test. - Ilia Polian; Jens Anders; Steffen Becker 001; Paolo Bernardi; Krishnendu Chakrabarty; Nourhan Elhamawy; Matthias Sauer 002; Adit D. Singh; Matteo Sonza Reorda; Stefan Wagner 001 (ATS, 2020)

An Open-Source Area-Optimized ECEG Cryptosystem in Hardware. - Nourhan Elhamawy; Maël Gay; Ilia Polian (ISVLSI, 2020)

Security, Reliability and Test Aspects of the RISC-V Ecosystem. - Jaume Abella 001; Sergi Alcaide; Jens Anders; Francisco Bas; Steffen Becker 001; Elke De Mulder; Nourhan Elhamawy; Frank K. Gürkaynak; Helena Handschuh; Carles Hernández 001; Michael Hutter; Leonidas Kosmidis; et al. (ETS, 2021)

Intelligent Methods for Test and Reliability. - Hussam Amrouch; Jens Anders; Steffen Becker 001; Maik Betka; Gerd Bleher; Peter Domanski; Nourhan Elhamawy; Thomas Ertl; Athanasios Gatzastras; Paul R. Genssler; Sebastian Hasler; Martin Heinrich; et al. (DATE, 2022)

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors. - Jens Anders; Pablo Andreu; Bernd Becker 001; Steffen Becker 001; Riccardo Cantoro; Nikolaos Ioannis Deligiannis; Nourhan Elhamawy; Tobias Faller; Carles Hernández 001; Nele Mentens; Mahnaz Namazi Rizi; Ilia Polian; et al. (ETS, 2023)

Scenario-based Test Content Optimization: Scan Test vs. System-Level Test. - Nourhan Elhamawy; Jens Anders; Ilia Polian; Matthias Sauer 002 (VTS, 2024)

Towards Understanding of System-Level Test Unique Fails. - Nourhan Elhamawy; Jens Anders; Ilia Polian; Matthias Sauer 002 (ETS, 2025)