On the test of single via related defects in digital VLSI designs. - Nunzio Mirabella; Maurizio Ricci; Michelangelo Grosso (DDECS, 2020)

Comparing different solutions for testing resistive defects in low-power SRAMs. - Nunzio Mirabella; Michelangelo Grosso; Giovanna Franchino; Salvatore Rinaudo; Ioannis Deretzis; Antonino La Magna; Matteo Sonza Reorda (LATS, 2021)

A comparative overview of ATPG flows targeting traditional and cell-aware fault models. - Nunzio Mirabella; Andrea Floridia; Riccardo Cantoro; Michelangelo Grosso; Matteo Sonza Reorda (ICECS 2022, 2022)

Recent Trends and Perspectives on Defect-Oriented Testing. - Paolo Bernardi; Riccardo Cantoro; Anthony Coyette; W. Dobbeleare; Moritz Fieback; Andrea Floridia; G. Gielenk; Jhon Gomez; Michelangelo Grosso; Andrea Guerriero; Iacopo Guglielminetti; Said Hamdioui; et al. (IOLTS, 2022)

Targeting different defect-oriented fault models in IC testing: an experimental approach. - Nunzio Mirabella; Andrea Floridia; Riccardo Cantoro; Michelangelo Grosso; Matteo Sonza Reorda (DSD, 2023)

New techniques for quality and reliability enhancement in electronic systems. - Nunzio Mirabella (2024)